Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications

Surveying and comparing all techniques relevant for practical applications, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. Completely revised and updated, sections include electron, ion and photon detection, as well as scanning microscopy, while new chapters have been added to cover such recently developed techniques as SNOM, SERS, and laser ablation. Over 500 references and a list of equipment suppliers make this a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.

INTRODUCTION
ELECTRON DETECTION
Photoelectron Spectroscopy (XPS, UPS)
Auger Electron Spectroscopy (AES, SAM)
Electron Energy Loss Spectroscopy (EELS)
Low-energy Electron Diffraction (LEED)
ION DETECTION
Static Secondary Ion Mass Spectrometry (SSIMS)
Dynamic Secondary Ion Mass Spectrometry (SIMS)
Electron Beam and HF-Plasma Secondary Neutral Mass Spectrometry (SNMS)
Laser-SNMS
Rutherford Backscattering Spectroscopy (RBS)
Low Energy Ion Scattering (LEIS)
Nuclear Reaction Analysis (NRA)
PHOTON DETECTION
Total Reflection X-Ray Fluorescence Analysis (TXRF)
Energy-dispersive X-ray Spectroscopy (EDXS)
Grazing Incidence X-Ray Methods for Near-surface Structural Studies
Glow Discharge Optical Emission Spectroscopy (GD-OES)
Surface Analysis by Laser Ablation
Ion Beam Spectrochemical Analysis (IBSCA)
Reflection Absorption IR Spectroscopy (RAIRS)
Surface-enhanced Raman Scattering (SERS)
UV/VIS/IR Ellipsometry (ELL)
SCANNING MICROSCOPY
Atomic Force Microscopy (AFM)
Scanning Tunneling Microscopy (STM)
MISCELLANEOUS
LEEM
TXRF-NEXAFS
GIXRF-NEXAFS
SNOM
EF-TEM
SFG
SHG
FIM/AP
SUMMARY AND COMPARISON OF TECHNIQUES
SURFACE ANALYTICAL EQUIPMENT SUPPLIERS
REFERENCES

Gernot Friedbacher is Associate Professor of Analytical Chemistry at the Vienna University of Technology. He is member of the International Advisory Board of Analytical and Bioanalytical Chemistry and Microchimica Acta. His research activities are focussed on investigation of surfaces and surface processes with scanning probe microscopy and electron probe x-ray microanalysis. Prof. Friedbacher has published over 110 research articles, reviews, and book chapters.

Henning Bubert is working at the Institute of Spectrochemistry and Applied Spectroscopy in Dortmund (ISAS).